The evolutionary path of semiconductor ATE (automated test equipment) seemed clear at Semicon West, held July 13–15 in San Francisco. Gone are the expensive, big-iron functional testers of yesterday, ...
The approach to high-end aerospace/defense test system development is shifting from application-specific systems to common core automated systems to reduce overall cost and increase flexibility.
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
The M5504 also includes integrated device power supplies with precision power sequencing and ramping controls. This makes the M5504 an all-inclusive solution that can perform both AC characterization ...
Agilent Technologies has introduced the GS-8210 low-cost mobile phone functional test system for use in manufacturing, QA, or as a go/no-go tester in servicing. The test system consists of an N9360 ...
The approach to high-end aerospace/defense test system development is shifting from application-specific systems to common core automated systems to reduce overall cost and increase flexibility.
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