MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...
SAN JOSE, Calif. — Continuing on its collision course with Applied Materials Inc., rival KLA-Tencor Corp. is making a new bid in the defect review and classification equipment market. KLA-Tencor ...
SAN JOSE–KLA-Tencor Corp. today announced it was offering the industry's first inline, non-contact system for monitoring electrical defects in processed wafers. The metrology giant claimed the new ...
MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...
KLA (KLAC) is not like other semiconductor equipment companies, and that difference is becoming more important as AI drives a ...
In summer 2020, KLA Corporation announced the formation of KLA Instruments™, a group that develops, markets and services measurement and defect inspection systems that are used primarily by research ...
Several equipment makers are developing or ramping up a new class of wafer inspection systems that address the challenges in finding defects in advanced chips. At each node, the feature sizes of the ...
KLA has announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection ...
Failure analysis typically begins with identifying a region of interest (ROI) on a sample for detailed examination using tools such as a Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), or ...
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