The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...
This white paper describes the functionality of user defined fault models (UDFM), including gate exhaustive UDFM and cell-aware UDFM, and the effectiveness of lowering DPM in devices. To achieve today ...
ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.
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