Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
FormFactor FORM is leaving no stone unturned to expand semiconductor wafer probe card production. This is evident from the recent opening of the company’s new probe card manufacturing facility in ...
STAr Technologies, a leading supplier of semiconductor test systems and probe cards, announces the immediate availability of the Aries-Optima MEMS probe card, the world's first fine-pitch high-current ...
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