Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Electronics design and testing were once two distinct functions where an electronic design was breadboarded and populated before testing. Problems that emerged during testing may have forced some time ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

There’s no secret that tighter time-to-market cycles have caused engineering design cycles to get shorter. This in turn puts pressure on test equipment to capture any design flaws, not an easy task ...