Semiconductor Engineering

Full-Chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)

Abstract: The electron beam inspection methodology for voltage contrast (VC) defects has been widely adopted in the early stages of sub-10nm logic and memory technology development, as well as in new ...
EurekAlert!

Automated concrete bridge damage detection: a new method using vision transformer-enhanced YOLO

A new method for automated concrete bridge damage detection using an efficient Vision Transformer-enhanced anchor-free YOLO (You Only Look Once) has been proposed by researchers from the University of ...